Application · XRF & PMI
XRF & PMI
Non-destructive elemental analysis — from field PMI to laboratory XRF.
The inspection problem
PMI, alloy sorting, coatings analysis and scrap-yard verification all need fast, non-destructive elemental analysis without sample preparation.
Why it matters
XRF is fast, portable and non-destructive, but it does not measure light elements the way OES does. Choosing the right method matters.
Which method fits your part?
Every method has a sweet spot and a limitation. Choose based on defect, geometry, throughput and access — not on habit.
Handheld XRF
When it fits: PMI in the field, alloy sorting, scrap and recycling.
Limitations: Cannot measure carbon and other light elements OES quantifies.
Benchtop XRF
When it fits: Laboratory analysis with better precision and matrix control.
Limitations: Sample geometry and preparation matter.
Technology hubs behind these methods
Principals whose equipment solves this
Selection is driven by the application — not the other way around.
Where we deploy this application
Metal Processing
EMUS equips metal-processing operations with metrology, material analysis and surface inspection that keep tolerances tight and customers satisfied.
Learn moreFoundries
EMUS helps foundries find porosity, shrinkage and inclusions early — reducing scrap, protecting customer relationships and improving the process itself.
Learn moreEnergy
EMUS helps energy manufacturers and operators verify the integrity of turbines, pressure parts and welds where failure is not an option.
Learn moreResearch & Laboratories
EMUS supports research institutes and laboratories with leading metrology, CT and material analysis instruments — plus the methods and support to use them well.
Learn moreEngineering support behind the equipment
- Method comparison between XRF and OES for your application.
- System selection and validation on your samples.
- Training and long-term support.
You may also need
Talk to an EMUS Engineer
Share your part, defect type and throughput target — we'll match the right method for xrf & pmi.