GNR Analytical Instruments|X-Ray Diffractometers (XRD)

APD 2000 Pro

Name: APD 2000 Pro
Brand: GNR Analytical Instruments

Laboratory X-Ray Diffractometer

High-power Theta/Theta laboratory powder X-ray diffractometer for phase and structural analysis, with a wide range of attachments.

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Overview

About the APD 2000 Pro

APD 2000 PRO Diffractometer is designed to be the best solution for phase and structural analysis of powder samples.

It could be equipped with various attachments for your special field of research.

APD 2000 PRO diffractometer is an high power – Theta/Theta – laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of polycrystalline materials.

Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humidity chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.

Key features

High Speed Rate (1000°/min)
High Precision Angle Reproducibility (+/- 0.0001°)
Fast Measurement and Highly Reliable Data
Extremely precise angular values thanks to stepper motors with optical encoders
Easy to handle
Qualiltative and Quantitative Powder X-Ray Diffractometer
High Stability X-Ray generator through precision feedback control circuits
Automatic ramp of the high voltage and emission current to preset values
Ceramic X-Ray tubes with high reproducibility and stability of focus position
Microfocus tubes and policapillary collimators
Possibility of changing automatically from transmission to reflection mode
High precision, high speed goniometer controlled by optical encoders
Traditional, rotating, multi sample and capillary sample holders
Scintillation counters, silicon strip and energy dispersive detectors
Non-ambient analysis, low and high temperature chambers, humidity device

Applications

Documented applications

Qualitative and quantitative phase analysis, non-ambient analysis, retained austenite quantification, structure solution and refinement, crystallite size and crystallinity calculations.

Geology and Mineralogy / Clays
Glass / Ceramics / Cement
Chemicals / Petrochemicals
Catalyst / Polymers
Forensics
Agricultural Sciences
Biosciences / Environmental
Pharmaceuticals
Cosmetics
Art and Archeology

Matrices, elements and ranges depend on the configuration supplied; EMUS confirms them in the quotation.

Industries

Sectors served

Research & Laboratories Metal Processing Automotive

GNR application fields

Chemical & PetrochemicalClinicalEnvironmentMaterial ScienceMetalsPharmaceutical

Specifications

Technical data

X Ray Generator

Maximum Output Power: 3 kW
Max Output Voltage: 60 kV
Max Output Current: 60 mA

X-Ray Tube

Tube / anode: Glass (option ceramic), Cu anode (options: Co, Fe, Cr, Mo, W, Ag)
Focus: 0.4 x 8 mm FF (Fine Focus) (options: 0.4 x 12 mm LFF; 1 x 10 mm NF)

Goniometer

Configurations: Theta/Theta geometry
Measuring circle radius: 160 mm
Scanning Angular Range: – 5° < 2-Theta < + 160° (according to accessories)
Angle positioning: Stepping motors with optical encoders
Angular accuracy: better than ± 0.02° over the whole 2-Theta range
Angular resolution: < 0.04 2-Theta on LaB6 (110) peak

Detector

1D/2D detectors

Silicon Drift Detectors (SDDs)

Case

External Dimensions: 950 W x 789 D x 1952 H mm; Leakage X-rays< 1 mSv/Year (full safety shielding according to the international guidelines)

Processing Unit

Computer Type: Personal Computer, the latest version
Items controlled: X-ray generator, goniometer, sample holder, detector, counting chain

Reproduced from official GNR product information. Values apply to the configuration described by GNR; final configuration is confirmed in the EMUS quotation.

Software

Operating software

Data Collection Programs
GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).
SAX
Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.
Search and Match: MATCH!
Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.

Downloads

Brochures & application notes

APD 2000 Pro — brochure (2025)

PDF · Brochure

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