Explorer
Flexibility and Modularity without limits
Multi-purpose, high-resolution Theta/Theta X-ray diffractometer with a modular design that can be upgraded over time.
About the Explorer
Explorer is a multi purpose – Theta/Theta – high resolution diffractometer which, thanks to its direct drive torque motors, offers top performances in many analytical areas, from phase analysis to determination of microstructural properties on bulk or thin film materials.
Thanks to its modularity and the wide range of accessories and attachments available, Explorer allows to perform measurement in different configurations:
The modularity and the flexibility of the Explorer equipment allows to start with an entry-level system which can be upgraded to meet new end user requirements. GNR could supply a wide range of X-ray sources, optics, sample holders, detectors and configurations to satisfy several analytical needs.
With no limits to its applications, Explorer modular system offers high performances in all analytical areas, ranging from phases quantification of mixtures, to the determination of microstructural properties as residual stress and preferred orientation of crystallites on bulk materials as well as on thin films.
- X-Ray Powder Diffraction (XPD)
- Reflectometry (XRR)
- Grazing Incidence X-Ray Diffraction (GIXRD)
- High Resolution X-Ray Diffraction (HRXRD)
- Total X-Ray Fluorescence (TXRF)
- Residual Stress and Texture X-Ray Diffraction.
Documented applications
The high resolution reflectometry studies can be performed with EXPLORER to characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).
The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.
- Routine Cystalline phase identification and quantification
- Crystallite size – lattice strain and crystallinity calculation
- Polymorph screening and crystal structure analysis
- Residual Stress and Retained Austenite Quantification
- Thin Films, Depth Profiling and non ambient analysis
- Phase Transition monitorin, tecture and preferred orientations
- The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.
- Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers.
Matrices, elements and ranges depend on the configuration supplied; EMUS confirms them in the quotation.
Sectors served
GNR application fields
Technical data
- Maximum Output Power
- 3 kW
- Max Output voltage
- 60 kV
- Max Output current
- 60 mA
- Voltage Step width
- 0.1 kV
- Current Step width
- 0.1 mA
- Tube / anode
- Glass (option ceramic), Cu anode (options: Co, Fe, Cr, Mo, W, Ag)
- 0.4 x 12 mm LFF (Long Fine Focus)
- (options
- 0.4 x 8 mm FF; 1×10 mm NF)
- Configuration
- Vertical Theta/Theta geometry
- Measuring circle diameters
- from 400 to 600 mm
- Angular Range
- – 110° < 2 Theta < + 168° (according to accessories)
- Angle positioning
- Direct drive torque motors with optical encoders
- Smallest selectable stepsize
- 0.0001°
- Angular accuracy
- Better than ± 0.01° over the whole 2-Theta range
- 1D/2D detectors
- Silicon Drift Detectors (SDDs)
- External Dimensions
- width 1427 mm, height 1976 mm, depth 1080 mm
- Weight
- 605 kg
- Computer Type
- Personal Computer, the latest version
- Items controlled
- X-ray generator, goniometer, sample holder, detector, counting chain
Reproduced from official GNR product information. Values apply to the configuration described by GNR; final configuration is confirmed in the EMUS quotation.
Operating software
- Data Collection Programs
- GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).
- SAX
- Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.
- Search and Match: MATCH!
- Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.
Brochures & application notes
Explorer — brochure
PDF · Brochure
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CompareHow EMUS supports this
Equipment is only part of the answer. Every system we supply is backed by regional engineering, service and application support.
Mechanical, electrical, environmental setup done right the first time.
Qualification and acceptance testing against real criteria.
Operator and application training built around your parts.
Traceable calibration to keep measurements audit-ready.
Preventive and corrective service across the Balkan region.
Method development and problem-solving with our engineers.
GNR Analytical Instruments
TheExplorer is part of the GNR Analytical Instruments portfolio, supplied and supported by EMUS across the Balkan region.
Request Technical Consultation
Talk to an EMUS engineer about theExplorer, your materials and the analytical configuration that fits your laboratory or production line.