Profiler
Handheld 3D optical profilometer for high-resolution surface roughness measurement of flat and curved components — profile-based (ISO 4287) and areal (ISO 25178).
About theProfiler
The Profiler is a handheld 3D profilometer for high-resolution surface roughness measurement. Users measure roughness of flat and curved components with only one system. Measurements are performed both profile-based (ISO 4287) and areal-based (ISO 25178). The lightweight Profiler consists of a 3D measurement sensor and a robust, handy framework. (Content sourced from the official Bruker Alicona product page; a dedicated product brochure was not part of the uploaded documentation.)
What sets theProfiler apart
Handheld and lightweight
A 3D measurement sensor in a robust, handy framework for flexible use.
Profile and areal roughness
Measures both profile-based (ISO 4287) and areal-based (ISO 25178) roughness.
Flat and curved components
High-resolution surface roughness measurement with only one system.
Where theProfiler is used
- Surface roughness measurement (ISO 4287 and ISO 25178)
- Roughness measurement of curved components
- Portable quality assurance
Official brochures
Bruker Alicona Magazine — Industries, Applications & Success Stories
Additional documents
Other Bruker Alicona products
How EMUS supports this
Equipment is only part of the answer. Every system we supply is backed by regional engineering, service and application support.
Mechanical, electrical, environmental setup done right the first time.
Qualification and acceptance testing against real criteria.
Operator and application training built around your parts.
Traceable calibration to keep measurements audit-ready.
Preventive and corrective service across the Balkan region.
Method development and problem-solving with our engineers.
Bruker Alicona
Profiler is part of the Bruker Alicona portfolio, represented by EMUS across the Balkan region.
Request an Engineering Consultation
Talk to an EMUS engineer about theProfiler and whether it fits your measurement workflow.