Printed Flexible Probes (P-Flex)
P-Flex printed flexible eddy current array probes conform to complex surfaces, combining replaceable arrays with three coil formats for tailored coverage and small-crack detection.
Product overview
P-Flex is a family of printed flexible eddy current array (ECA) probes designed for complex and irregular surface geometries. A 0.2 mm (0.008 in) profile and minimum bending radius of 2 mm (0.08 in) allow the probes to mount on custom holders for access to tight or difficult-to-reach areas.
The printed coil arrays use Eddyfi Technologies’ SmartMUX and advanced multiplexing topologies. The page attributes improved signal-to-noise ratio and coil uniformity relative to other printed probes to this design, supporting the detection of small flaws. Small, medium, and large coil formats provide different balances of coverage and detection performance; selection depends on the smallest defect of interest, required array coverage, and whether the inspected material is ferromagnetic.
Each flexible probe detaches from its cable adapter for replacement and can be reused with different holders. For specialized inspection geometries, Eddyfi Technologies offers custom probe design and manufacturing, including extended-coverage arrays integrated into holders tailored to the application.
Key capabilities
Flexible, thin profile
The 0.2 mm (0.008 in) probe thickness and 2 mm (0.08 in) minimum bending radius support inspection of complex surfaces.
Three coil formats
Small, medium, and large formats provide different coverage and minimum detectable crack lengths.
Detachable array
The probe disconnects from its cable adapter to simplify replacement.
Reusable with different holders
The same flexible probe can be mounted on different holders for inspection of various surfaces.
Printed coil performance
The printed coil design provides higher signal-to-noise ratio and coil uniformity than other printed probes, according to the page.
Advanced multiplexing
SmartMUX and advanced multiplexing topologies support small-flaw detection.
Custom array development
Custom design and manufacturing services enable extended array coverage and integration into holders of varied shapes and sizes.
Published technical specifications
Values as published by Eddyfi Technologies. Where models or variants differ, each is listed separately.
GENERAL
- Probe sizes
- Small; Medium; Large
- Probe thickness
- 0.2 mm (0.008 in)
- Minimum bending radius
- 2 mm (0.08 in)
Small
- Coverage
- 34 mm (1.3 in)
- Minimum detectable crack length
- 0.5 mm (0.02 in)
- Frequency range
- 1000 kHz – 4000 kHz
Medium
- Coverage
- 56 mm (2.2 in)
- Minimum detectable crack length
- 1.0 mm (0.04 in)
- Frequency range
- 250 kHz – 1500 kHz
Large
- Coverage
- 79 mm (3.1 in)
- Minimum detectable crack length
- 1.5 mm (0.06 in)
- Frequency range
- 250 kHz – 1500 kHz
- Minimum bending radius: 2 mm (0.08 in).
- Probe selection should account for the smallest defect to detect, required array coverage, and whether the inspected material is ferromagnetic.
Product imagery
Product videos
Official brochures
ECA Surface Probe Catalog
Other Eddyfi products
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CompareHow EMUS supports this
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Eddyfi Technologies
Part of the Eddyfi Technologies portfolio, represented by EMUS across the Balkan region.
Application Notes & resources
Official application notes and technical literature for Printed Flexible Probes (P-Flex).
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